A triple beam microscope: new frontiers in materials nanocharacterisation

This project aims to establish a triple beam ion and electron microscope facility for the modification, preparationand characterisation of materials that have hitherto been too sensitive for high resolution analysis with chargedparticle beams. It is expected that materials will be studied artefact-free and at the nanoscale with twin ion beamsand new detectors that allow novel imaging modes and extreme chemical sensitivity plus controlled atmospheretransfer to other instruments for correlative measurements. This unique facility should benefit research in manydisciplines such as physics, chemistry, geology, pharmacy, materials, civil and chemical engineering by allowingfirst-ever observations of vital phenomena in diverse materials.