Project Details
Description
The Project will develop novel inspection techniques that will provide spatially resolved images of the voltage and series resistance of individual sub-cells and entire multijunction cells. These techniques will enable fast and contactless monitoring of device efficiency at the end of the production line and the detection of possible damaging issues during each fabrication process. A full description of the Project is outlined under item 1.2 of Schedule 1 of the Head Agreement.
| Status | Finished |
|---|---|
| Effective start/end date | 5/12/22 → 30/01/26 |
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