Atomic Scale Identification of Amorphization and Relation Processes in Compound Semiconductors

  • Ridgway, Mark C (PI)
  • Byrne, Aidan (CoI)
  • Yu, Kin Man (CoI)

    Project: Research

    Project Details


    We seek a fundamental understanding of the processes that govern implantation-induced structure, at the nanometer scale, in the compound semiconductors used in photonic device fabrication. Since implantation-induced disorder limits the performance of such devices, the proposed project is of substantial technological significance and national benefit. The Photon Science techniques of perturbed angular correlation and extended x-ray absorption fine structure spectroscopy will be used to identify the mechanism of amorphisation and relaxation in order to enable more effective exploitation of compound semiconductors in advanced telecommunications systems.
    Effective start/end date1/01/0331/12/06


    • Australian Research Council (ARC): A$285,000.00


    Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.