Development of a Universal Super-TEM

This Project aims to design a universal super-high resolution transmission electron microscope that pioneersmethods to image any material at atomic resolution, and to trace its transient temporal-resolved behaviour at thesame time as measuring its mechanical, physical, electrical and thermal properties with optical manipulation usingstate-of-the-art in situ holders. This instrument will provide an unprecedented combination of spatial and temporalresolutions for materials characterisation: picometer spatial resolution of events ranging from microseconds tonanoseconds.