Development of Methods and Strategies for the Measurement, Interpretation and Analysis of Diffuse X-Ray Scattering from Disordered Materials

This application seeks to exploit our established lead in the measurement of diffuse scattering from disordered materials and its analysis using large-scale computer simulations. Many industrially important materials such as ceramics, superconductors, catalysts, electro-optical materials and minerals owe their special properties to the disorder in their structure. This disorder causes diffuse X-ray scattering which can be probed using synchrotron X-rays and powerful computers to reveal details about the material s nanoscale structure. The new methodology being developed will enhance our detailed understanding of the relationships between structure and properties in materials and help promote the design of new materials.