Focused Ion Beam System for Multidisciplinary Applications

A Focused Ion Beam (FIB)system to be housed in a central facility and configured for maximum flexibility and utility over a very wide range of disciplines and applications. It will be used for micromachining and nanoscale fabrication, as an imaging device sensitive to crystal orientation and as a preparation device for scanning and transmission electron microscopy. It will support research including electronic and opto-electronic materials, nanotechnology, complex mesoscale structures, earth sciences, small system optics, fracture behaviour of polymers and biocomposites.