State-of-the-art Hall effect system for detailed electrical characterisation in semiconductors

The Hall measurement system is a powerful semiconductor characterisation tool and enables us to determine the carrier type, carrier concentration and mobility. Such measurements will be carried out under variable magnetic field and temperature for detailed understanding of as grown and as deposited semiconductor structures and the mechanisms governing current transport in semiconductors. In addition, the proposed system enables us to determine a wide range of resistances (over 15 orders of magnitude) ranging from semi-insulating materials to highly conductive layers with Van der Pauw measurements. The Hall measurement system will benefit a range of projects with applications in optoelectronics, microelectronics and solar cells.