Structural Characterization of Ion Beam Synthesized Metallic Nanocrystals Using Advanced Synchrotron Based Analytical Techniques

    Project: Research

    Project Details

    Description

    Metallic nanocrystals formed by ion implantation into a dielectric material show high potential for use in optical filters, memories and all-optical switching devices. The macroscopic properties of nanocrystals can differ significantly from those of bulk material and are intimately related to the microscopic structural properties. The goal of this project is to develop a fundamental understanding of the structure of ion implanted metallic nanocrystals and its dependence on the fabrication parameters. This will enable efficient tailoring of nanocrystalline composite materials for advanced device applications. Investigations will largely involve synchrotron based analytical techniques.
    StatusFinished
    Effective start/end date1/06/0531/05/08

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