Swift Heavy Ion Tracks in Semiconductors and Insulators: New Insights using Synchrotron Scattering Experiments

A systematic investigation of the interaction of swift heavy ions with semiconductors and insulators is proposed. We seek to identify the structure and morphology of swift heavy ion tracks using innovative synchrotron based small-angle x-ray scattering experiments and perform in-situ annealing measurements to study the damage recovery dynamics. In combination with theoretical modeling we aim to understand and explain the underlying mechanisms and resolve existing controversy. This will yield fundamental new insights into ion-solid interactions with a high potential impact in a variety of scientific areas including materials science and engineering, nuclear physics, geochronology, archaeology, and interplanetary science.