A comparative schlieren imaging study between ns and sub-ps laser forward transfer of Cr

I. Zergioti*, D. G. Papazoglou, A. Karaiskou, C. Fotakis, E. Gamaly, A. Rode

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    45 Citations (Scopus)

    Abstract

    A comparative study of the effect of ultrashort (0.5 ps) and short (30 ns) pulses on the laser forward transfer of Cr is presented in this paper. The dynamics of the process was investigated by stroboscopic schlieren imaging for time delays up to 3 μs following the laser irradiation pulse. In contrast to the ns laser, the directionality of the ejected material is very high in the case of the sub-ps laser process. The narrow angular divergence (3°) of the sub-ps pulses permits the direct dynamic transfer of the material and opens up new application possibilities for the fabrication of high spatial resolution microstructures.

    Original languageEnglish
    Pages (from-to)177-180
    Number of pages4
    JournalApplied Surface Science
    Volume208-209
    Issue number1
    DOIs
    Publication statusPublished - 15 Mar 2003

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