A high-sensitivity photon counting imaging system (PCIS) for luminescence analysis

I. McCulloch; N. A. Spooner; D. Jones

doi:10.1016/j.radmeas.2011.06.048

A high-sensitivity photon counting imaging system (PCIS) for luminescence analysis

I. McCulloch, N. A. Spooner^*, D. Jones

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

The Photon Counting Imaging System (PCIS) has been developed to extend the capabilities of traditional luminescence dating technologies by providing a spatially-resolved (imaged) output and a significantly extended spectral range for the detection of luminescence signals, at an overall sensitivity comparable to that of non-imaging luminescence detectors. It is capable of a wide range of both luminescence dating and materials analysis applications, utilising a variety of optical stimulation sources in addition to thermal stimulation, and incorporates easily inter-changeable optical filters for the spectral discrimination of luminescence emissions.

Original language	English
Pages (from-to)	1566-1570
Number of pages	5
Journal	Radiation Measurements
Volume	46
Issue number	12
DOIs	https://doi.org/10.1016/j.radmeas.2011.06.048
Publication status	Published - Dec 2011

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10.1016/j.radmeas.2011.06.048

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abstract = "The Photon Counting Imaging System (PCIS) has been developed to extend the capabilities of traditional luminescence dating technologies by providing a spatially-resolved (imaged) output and a significantly extended spectral range for the detection of luminescence signals, at an overall sensitivity comparable to that of non-imaging luminescence detectors. It is capable of a wide range of both luminescence dating and materials analysis applications, utilising a variety of optical stimulation sources in addition to thermal stimulation, and incorporates easily inter-changeable optical filters for the spectral discrimination of luminescence emissions.",

keywords = "IRSL, Luminescence imaging, OSL, Offner, Single grain dating, TL",

author = "I. McCulloch and Spooner, \{N. A.\} and D. Jones",

year = "2011",

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AU - Spooner, N. A.

AU - Jones, D.

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AB - The Photon Counting Imaging System (PCIS) has been developed to extend the capabilities of traditional luminescence dating technologies by providing a spatially-resolved (imaged) output and a significantly extended spectral range for the detection of luminescence signals, at an overall sensitivity comparable to that of non-imaging luminescence detectors. It is capable of a wide range of both luminescence dating and materials analysis applications, utilising a variety of optical stimulation sources in addition to thermal stimulation, and incorporates easily inter-changeable optical filters for the spectral discrimination of luminescence emissions.

KW - IRSL

KW - Luminescence imaging

KW - OSL

KW - Offner

KW - Single grain dating

KW - TL

UR - https://www.scopus.com/pages/publications/82355185868

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VL - 46

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JO - Radiation Measurements

JF - Radiation Measurements

IS - 12

ER -

A high-sensitivity photon counting imaging system (PCIS) for luminescence analysis

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