A New Multi-Modal Similarity Measure for Fast Gradient-Based 2D-3D Image Registration

Mark Pickering; Abdullah Muhit; Jennie Scarvell; Paul Smith

A New Multi-Modal Similarity Measure for Fast Gradient-Based 2D-3D Image Registration

Mark Pickering, Abdullah Muhit, Jennie Scarvell, Paul Smith

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings of IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009)
Editors	Conference Program Committee
Place of Publication	USA
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	4
Edition	Peer Reviewed
Publication status	Published - 2009
Event	IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009) - Minneapolis USA Duration: 1 Jan 2009 → …

Conference

Conference	IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009)
Period	1/01/09 → …
Other	September 2-6 2009

Cite this

Pickering, Mark ; Muhit, Abdullah ; Scarvell, Jennie et al. / A New Multi-Modal Similarity Measure for Fast Gradient-Based 2D-3D Image Registration. Proceedings of IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009). editor / Conference Program Committee. Peer Reviewed. ed. USA : Institute of Electrical and Electronics Engineers Inc., 2009. pp. 4

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title = "A New Multi-Modal Similarity Measure for Fast Gradient-Based 2D-3D Image Registration",

author = "Mark Pickering and Abdullah Muhit and Jennie Scarvell and Paul Smith",

year = "2009",

language = "English",

pages = "4",

editor = "{Conference Program Committee}",

booktitle = "Proceedings of IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009)",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

edition = "Peer Reviewed",

note = "IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009) ; Conference date: 01-01-2009",

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Pickering, M, Muhit, A, Scarvell, J & Smith, P 2009, A New Multi-Modal Similarity Measure for Fast Gradient-Based 2D-3D Image Registration. in CPC (ed.), Proceedings of IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009). Peer Reviewed edn, Institute of Electrical and Electronics Engineers Inc., USA, pp. 4, IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009), 1/01/09.

A New Multi-Modal Similarity Measure for Fast Gradient-Based 2D-3D Image Registration. / Pickering, Mark; Muhit, Abdullah; Scarvell, Jennie et al.
Proceedings of IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009). ed. / Conference Program Committee. Peer Reviewed. ed. USA: Institute of Electrical and Electronics Engineers Inc., 2009. p. 4.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A New Multi-Modal Similarity Measure for Fast Gradient-Based 2D-3D Image Registration

AU - Pickering, Mark

AU - Muhit, Abdullah

AU - Scarvell, Jennie

AU - Smith, Paul

PY - 2009

Y1 - 2009

M3 - Conference contribution

SP - 4

BT - Proceedings of IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009)

A2 - null, Conference Program Committee

PB - Institute of Electrical and Electronics Engineers Inc.

CY - USA

T2 - IEEE International Conference of the Engineering in Medicine and Biology Society (EMBS 2009)

Y2 - 1 January 2009

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