TY - GEN
T1 - A NURBS-based spectral reflectance descriptor with applications in computer vision and pattern recognition
AU - Cong, Phuoc Huynh
AU - Robles-Kelly, Antonio
PY - 2008
Y1 - 2008
N2 - In this paper, we present a surface reflectance descriptor based on the control points resulting from the interpolation of Non-Uniform Rational B-Spline (NURBS) curves to multispectral reflectance data. The interpolation is based upon a knot removal scheme in the parameter domain. Thus, we exploit the local support of NURBS so as to recover a compact descriptor robust to noise and local perturbation of the spectra. We demonstrate the utility of our NURBS-based descriptor for material identification. To this end, we perform skin spectra recognition making use of a Support Vector Machine classifier. We also provide results on hyperspectral imagery and elaborate on the preprocessing step for skin segmentation. We compare our results with those obtained using an alternative descriptor.
AB - In this paper, we present a surface reflectance descriptor based on the control points resulting from the interpolation of Non-Uniform Rational B-Spline (NURBS) curves to multispectral reflectance data. The interpolation is based upon a knot removal scheme in the parameter domain. Thus, we exploit the local support of NURBS so as to recover a compact descriptor robust to noise and local perturbation of the spectra. We demonstrate the utility of our NURBS-based descriptor for material identification. To this end, we perform skin spectra recognition making use of a Support Vector Machine classifier. We also provide results on hyperspectral imagery and elaborate on the preprocessing step for skin segmentation. We compare our results with those obtained using an alternative descriptor.
UR - http://www.scopus.com/inward/record.url?scp=51949111941&partnerID=8YFLogxK
U2 - 10.1109/CVPR.2008.4587772
DO - 10.1109/CVPR.2008.4587772
M3 - Conference contribution
SN - 9781424422432
T3 - 26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
BT - 26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
T2 - 26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
Y2 - 23 June 2008 through 28 June 2008
ER -