TY - GEN
T1 - A pixel-wise robust extended Kalman filter for restoration of geometrically warped anisoplanatic images
AU - Kallapur, Abhijit
AU - Tahtali, Murat
AU - Petersen, Ian
PY - 2010
Y1 - 2010
N2 - This paper presents the application of a robust extended Kalman filter (REKF) for an image processing problem in order to mitigate the effects of noise introduced during registration of geometrically warped anisoplanatic images. Emphasis is laid upon maintaining accuracy at the pixel-level. The perceived wander (random motion) of image intensities at the pixel level is modeled as a second-order oscillator, with a time-varying uncertain natural frequency. A robust extended Kalman filter (REKF) is used to estimate the state of the uncertain system and restore the pixel wander from a set of synthetically generated noisy measurements of registration shiftmaps. Also, a comparison of REKF and standard EKF estimation methods is presented.
AB - This paper presents the application of a robust extended Kalman filter (REKF) for an image processing problem in order to mitigate the effects of noise introduced during registration of geometrically warped anisoplanatic images. Emphasis is laid upon maintaining accuracy at the pixel-level. The perceived wander (random motion) of image intensities at the pixel level is modeled as a second-order oscillator, with a time-varying uncertain natural frequency. A robust extended Kalman filter (REKF) is used to estimate the state of the uncertain system and restore the pixel wander from a set of synthetically generated noisy measurements of registration shiftmaps. Also, a comparison of REKF and standard EKF estimation methods is presented.
UR - http://www.scopus.com/inward/record.url?scp=78649410417&partnerID=8YFLogxK
U2 - 10.1109/CCA.2010.5611098
DO - 10.1109/CCA.2010.5611098
M3 - Conference contribution
SN - 9781424453627
T3 - Proceedings of the IEEE International Conference on Control Applications
SP - 280
EP - 285
BT - 2010 IEEE International Conference on Control Applications, CCA 2010
T2 - 2010 IEEE International Conference on Control Applications, CCA 2010
Y2 - 8 September 2010 through 10 September 2010
ER -