A Study on Fast Gates for Large-Scale Quantum Simulation with Trapped Ions

Richard L. Taylor*, Christopher D.B. Bentley, Julen S. Pedernales, Lucas Lamata, Enrique Solano, André R.R. Carvalho, Joseph J. Hope

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    11 Citations (Scopus)

    Abstract

    Large-scale digital quantum simulations require thousands of fundamental entangling gates to construct the simulated dynamics. Despite success in a variety of small-scale simulations, quantum information processing platforms have hitherto failed to demonstrate the combination of precise control and scalability required to systematically outmatch classical simulators. We analyse how fast gates could enable trapped-ion quantum processors to achieve the requisite scalability to outperform classical computers without error correction. We analyze the performance of a large-scale digital simulator, and find that fidelity of around 70% is realizable for π-pulse infidelities below 10-5 in traps subject to realistic rates of heating and dephasing. This scalability relies on fast gates: entangling gates faster than the trap period.

    Original languageEnglish
    Article number46197
    JournalScientific Reports
    Volume7
    DOIs
    Publication statusPublished - 12 Apr 2017

    Fingerprint

    Dive into the research topics of 'A Study on Fast Gates for Large-Scale Quantum Simulation with Trapped Ions'. Together they form a unique fingerprint.

    Cite this