TY - GEN
T1 - A unified formulation of invariant point pattern matching
AU - Caetano, Tibério S.
AU - Caelli, Terry
PY - 2006
Y1 - 2006
N2 - We present a unified framework for modeling and solving invariant point pattern matching problems. Invariant features are encoded as potentials in a probabilistic graphical model. By using a specific kind of graph topology, different types of invariant matching models can be implemented via tree-width selection. Models with tree-widths 1, 2, 3 and 4 implement translation, similarity, affine and protective invariant point matching, respectively. The optimal match is then found by exploiting the Markov structure of the graph through the generalized distributive law in a dynamic programming setting. In the absence of noise in the point coordinates, the solutions found are optimal. Our early experiments suggest the approach is robust to outliers and moderate noise.
AB - We present a unified framework for modeling and solving invariant point pattern matching problems. Invariant features are encoded as potentials in a probabilistic graphical model. By using a specific kind of graph topology, different types of invariant matching models can be implemented via tree-width selection. Models with tree-widths 1, 2, 3 and 4 implement translation, similarity, affine and protective invariant point matching, respectively. The optimal match is then found by exploiting the Markov structure of the graph through the generalized distributive law in a dynamic programming setting. In the absence of noise in the point coordinates, the solutions found are optimal. Our early experiments suggest the approach is robust to outliers and moderate noise.
UR - http://www.scopus.com/inward/record.url?scp=34147182233&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2006.192
DO - 10.1109/ICPR.2006.192
M3 - Conference contribution
SN - 0769525210
SN - 9780769525211
T3 - Proceedings - International Conference on Pattern Recognition
SP - 121
EP - 124
BT - Proceedings - 18th International Conference on Pattern Recognition, ICPR 2006
T2 - 18th International Conference on Pattern Recognition, ICPR 2006
Y2 - 20 August 2006 through 24 August 2006
ER -