A Universal Frequency Offset Estimator for OFDM Applications

Matt (Ming) Ruan; Mark Reed; Zhenning Shi

A Universal Frequency Offset Estimator for OFDM Applications

Matt (Ming) Ruan, Mark Reed, Zhenning Shi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings of IEEE Global Communications Conference, Exhibition & Industry Forum (GLOBECOM 2009)
Place of Publication	USA
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-5
Edition	Peer Reviewed
ISBN (Print)	9781424441488
Publication status	Published - 2009
Event	IEEE Global Communications Conference, Exhibition & Industry Forum (GLOBECOM 2009) - Hawaii USA Duration: 1 Jan 2009 → …

Conference

Conference	IEEE Global Communications Conference, Exhibition & Industry Forum (GLOBECOM 2009)
Period	1/01/09 → …
Other	November 30-December 4 2009

Cite this

@inproceedings{e1fd2da753ee439ba836ca38ff1c5445,

title = "A Universal Frequency Offset Estimator for OFDM Applications",

author = "Ruan, {Matt (Ming)} and Mark Reed and Zhenning Shi",

year = "2009",

language = "English",

isbn = "9781424441488",

pages = "1--5",

booktitle = "Proceedings of IEEE Global Communications Conference, Exhibition & Industry Forum (GLOBECOM 2009)",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

edition = "Peer Reviewed",

note = "IEEE Global Communications Conference, Exhibition & Industry Forum (GLOBECOM 2009) ; Conference date: 01-01-2009",

}

Ruan, M, Reed, M & Shi, Z 2009, A Universal Frequency Offset Estimator for OFDM Applications. in Proceedings of IEEE Global Communications Conference, Exhibition & Industry Forum (GLOBECOM 2009). Peer Reviewed edn, Institute of Electrical and Electronics Engineers Inc., USA, pp. 1-5, IEEE Global Communications Conference, Exhibition & Industry Forum (GLOBECOM 2009), 1/01/09.

A Universal Frequency Offset Estimator for OFDM Applications. / Ruan, Matt (Ming); Reed, Mark; Shi, Zhenning.
Proceedings of IEEE Global Communications Conference, Exhibition & Industry Forum (GLOBECOM 2009). Peer Reviewed. ed. USA: Institute of Electrical and Electronics Engineers Inc., 2009. p. 1-5.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A Universal Frequency Offset Estimator for OFDM Applications

AU - Ruan, Matt (Ming)

AU - Reed, Mark

AU - Shi, Zhenning

PY - 2009

Y1 - 2009

M3 - Conference contribution

SN - 9781424441488

SP - 1

EP - 5

BT - Proceedings of IEEE Global Communications Conference, Exhibition & Industry Forum (GLOBECOM 2009)

PB - Institute of Electrical and Electronics Engineers Inc.

CY - USA

T2 - IEEE Global Communications Conference, Exhibition & Industry Forum (GLOBECOM 2009)

Y2 - 1 January 2009

ER -