A zirconium oxide film self-assembled at the air-water interface

M. J. Henderson; A. Gibaud; J. F. Bardeau; A. R. Rennie; J. W. White

doi:10.1016/j.physb.2004.11.013

A zirconium oxide film self-assembled at the air-water interface

M. J. Henderson, A. Gibaud, J. F. Bardeau, A. R. Rennie, J. W. White^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

A self-assembled zirconia-based film, produced at the air-water interface using sodium dodecyl sulphate (SDS) as the template, has been characterised by energy-dispersive X-ray reflectometry, X-ray diffraction, and X-ray fluorescence analysis. Long-range order due to the lamellar liquid crystalline arrangement of the surfactant micelles was significant enough to produce Bragg diffraction. X-ray fluorescence from the specimens in the electron microscope indicates that the principal component of the film contains zirconium, oxygen and sulphate, -suggesting that the film contains zirconium polyoxo ions and surfactant. Raman spectroscopy indicates the presence of a zirconium hydroxide.

Original language	English
Pages (from-to)	27-33
Number of pages	7
Journal	Physica B: Condensed Matter
Volume	357
Issue number	1-2 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.physb.2004.11.013
Publication status	Published - 28 Feb 2005

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10.1016/j.physb.2004.11.013

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title = "A zirconium oxide film self-assembled at the air-water interface",

abstract = "A self-assembled zirconia-based film, produced at the air-water interface using sodium dodecyl sulphate (SDS) as the template, has been characterised by energy-dispersive X-ray reflectometry, X-ray diffraction, and X-ray fluorescence analysis. Long-range order due to the lamellar liquid crystalline arrangement of the surfactant micelles was significant enough to produce Bragg diffraction. X-ray fluorescence from the specimens in the electron microscope indicates that the principal component of the film contains zirconium, oxygen and sulphate, -suggesting that the film contains zirconium polyoxo ions and surfactant. Raman spectroscopy indicates the presence of a zirconium hydroxide.",

keywords = "Air-water interface, Thin film, Time-resolved X-ray reflectometry, Zirconium oxide",

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AU - Henderson, M. J.

AU - Gibaud, A.

AU - Bardeau, J. F.

AU - Rennie, A. R.

AU - White, J. W.

PY - 2005/2/28

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N2 - A self-assembled zirconia-based film, produced at the air-water interface using sodium dodecyl sulphate (SDS) as the template, has been characterised by energy-dispersive X-ray reflectometry, X-ray diffraction, and X-ray fluorescence analysis. Long-range order due to the lamellar liquid crystalline arrangement of the surfactant micelles was significant enough to produce Bragg diffraction. X-ray fluorescence from the specimens in the electron microscope indicates that the principal component of the film contains zirconium, oxygen and sulphate, -suggesting that the film contains zirconium polyoxo ions and surfactant. Raman spectroscopy indicates the presence of a zirconium hydroxide.

AB - A self-assembled zirconia-based film, produced at the air-water interface using sodium dodecyl sulphate (SDS) as the template, has been characterised by energy-dispersive X-ray reflectometry, X-ray diffraction, and X-ray fluorescence analysis. Long-range order due to the lamellar liquid crystalline arrangement of the surfactant micelles was significant enough to produce Bragg diffraction. X-ray fluorescence from the specimens in the electron microscope indicates that the principal component of the film contains zirconium, oxygen and sulphate, -suggesting that the film contains zirconium polyoxo ions and surfactant. Raman spectroscopy indicates the presence of a zirconium hydroxide.

KW - Air-water interface

KW - Thin film

KW - Time-resolved X-ray reflectometry

KW - Zirconium oxide

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DO - 10.1016/j.physb.2004.11.013

M3 - Article

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JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - 1-2 SPEC. ISS.

ER -

A zirconium oxide film self-assembled at the air-water interface

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