Advantages of Zn 1.25Sb 2Te 3 material for phase change memory

Guoxiang Wang*, Qiuhua Nie, Xiang Shen, Rongping Wang, Liangcai Wu, Yegang Lv, Jing Fu, Tiefeng Xu, Shixun Dai

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    18 Citations (Scopus)

    Abstract

    The thermal and electrical properties of Zn 1.25Sb 2Te 3 film have been investigated for phase change memory (PCM) applications. Compared with the conventional Ge 2Sb 2Te 5, Zn 1.25Sb 2Te 3 film exhibits a higher crystallization temperature (∼200°C), greater activation energy (2.71 eV), and better data retention of 10 years at 105°C. In addition, higher crystalline resistance and better resistance contrast are helpful to reduce RESET current and achieve a higher On/OFF ratio of PCM, respectively. Raman spectra of crystalline thin films suggests that the local bonding arrangement around Sb atoms changes; Sb 2Te 3 component is thus mainly responsible for the phase transition in Zn 1.25Sb 2Te 3 alloys.

    Original languageEnglish
    Pages (from-to)135-138
    Number of pages4
    JournalMaterials Letters
    Volume87
    DOIs
    Publication statusPublished - 15 Nov 2012

    Fingerprint

    Dive into the research topics of 'Advantages of Zn 1.25Sb 2Te 3 material for phase change memory'. Together they form a unique fingerprint.

    Cite this