Adversarially Robust Few-shot Learning via Parameter Co-distillation of Similarity and Class Concept Learners

Junhao Dong, Piotr Koniusz*, Junxi Chen, Xiaohua Xie, Yew Soon Ong*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Few-shot learning (FSL) facilitates a variety of computer vision tasks yet remains vulnerable to adversarial attacks. Existing adversarially robust FSL methods rely on either visual similarity learning or class concept learning. Our analysis reveals that these two learning paradigms are complementary, exhibiting distinct robustness due to their unique decision boundary types (concepts clustering by the visual similarity label vs. classification by the class labels). To bridge this gap, we propose a novel framework unifying adversarially robust similarity learning and class concept learning. Specifically, we distill parameters from both network branches into a 'unified embedding model' during robust optimization and redistribute them to individual network branches periodically. To capture generalizable robustness across diverse branches, we initialize adversaries in each episode with cross-branch class-wise 'global adversarial perturbations' instead of less informative random initialization. We also propose a branch robustness harmonization to modulate the optimization of similarity and class concept learners via their relative adversarial robustness. Extensive experiments demonstrate the state-of-the-art performance of our method in diverse few-shot scenarios.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024
PublisherIEEE Computer Society
Pages28535-28544
Number of pages10
ISBN (Electronic)9798350353006
DOIs
Publication statusPublished - 2024
Event2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024 - Seattle, United States
Duration: 16 Jun 202422 Jun 2024

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (Print)1063-6919

Conference

Conference2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024
Country/TerritoryUnited States
CitySeattle
Period16/06/2422/06/24

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