An optical comparison of silicone and eva encapsulants for conventional silicon PV modules: A ray-tracing study

Keith R. McIntosh, James N. Cotsell, Jeff S. Cumpston, Ann W. Norris, Nick E. Powell, Barry M. Ketola

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    110 Citations (Scopus)

    Abstract

    Ray-trace simulation is used to quantify the optical losses of photovoltaic modules containing silicon cells. The simulations show that when the module's encapsulant is silicone rather than ethylene vinyl acetate (EVA), the module's short-circuit current density under the AM1-5g spectrum is 0.7-1 .1% higher for screen-printed multi-cSi cells, 0.5-1.2% higher for screen-printed mono-cSi cells, and 1.0-1.6% higher for high-efficiency rear-contact cells, depending on the type of silicone. This increase is primarily due to the transmission of short-wavelength light (<420 nm) and is therefore greatest when used with low UV-absorbing glass and cells of a high IQE at short wavelength. We also quantify absorption in the glass, EVA and silicone at longer wavelengths and describe the influence of an encapsulant's refractive index on escape losses.

    Original languageEnglish
    Title of host publication2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
    Pages544-549
    Number of pages6
    DOIs
    Publication statusPublished - 2009
    Event2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 - Philadelphia, PA, United States
    Duration: 7 Jun 200912 Jun 2009

    Publication series

    NameConference Record of the IEEE Photovoltaic Specialists Conference
    ISSN (Print)0160-8371

    Conference

    Conference2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
    Country/TerritoryUnited States
    CityPhiladelphia, PA
    Period7/06/0912/06/09

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