An X-ray reflectivity study of evaporation-induced self-assembled titania-based films

M. J. Henderson, A. Gibaud*, J. F. Bardeau, J. W. White

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    37 Citations (Scopus)

    Abstract

    X-Ray reflectivity was used to monitor the structural development of a titania-based film at the solid/air interface by evaporation-induced self-assembly (EISA). A nonionic poly(ethylene oxide)-based surfactant, Brij 58, was used as the template and titanium chloride as the inorganic precursor. The reflectivity pattern, film thickness and refractive index were shown to be dependent on film deposition method, whether by casting or by dip-coating onto a silicon wafer, the Brij 58 TiO2 ratio and the relative humidity. At Brij 58 contents of 40 wt%, the reflectivity profile displayed only a single diffraction peak. At 70 wt% Bragg diffraction indicated a lamellar ordering of film components. Modelled reflectivity data suggested a 1060 Å thick film that comprised 17 layers of alternating surfactant and titania with a d spacing of about 60 Å. The effect of relative humidity on film structure was explored.

    Original languageEnglish
    Pages (from-to)2478-2484
    Number of pages7
    JournalJournal of Materials Chemistry
    Volume16
    Issue number25
    DOIs
    Publication statusPublished - 2006

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