Analysis of ultrathin high-efficiency silicon solar cells

Daniel Kray*, Keith R. Mcintosh

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    21 Citations (Scopus)

    Abstract

    In this paper we present experimental data on ultrathin silicon wafer solar cells as well as the analytical description of their open-circuit voltage and fill factor. For this we use the analytical model of Fischer and Plagwitz to describe the rear surface recombination that we extend for very low wafer thicknesses. We observe an unexpected drop of the cell voltage at∼40 μm thickness. This decrease cannot be described by the used models and is not reproduced via DESSIS simulations. From the new series resistance formula we can derive an analytical relationship for the fill factor. This allows us to perform a loss analysis of the cells and an optimization of the point contact pitch for different cell thicknesses.

    Original languageEnglish
    Pages (from-to)1647-1654
    Number of pages8
    JournalPhysica Status Solidi (A) Applications and Materials Science
    Volume206
    Issue number7
    DOIs
    Publication statusPublished - Jul 2009

    Fingerprint

    Dive into the research topics of 'Analysis of ultrathin high-efficiency silicon solar cells'. Together they form a unique fingerprint.

    Cite this