Analyzing Carrier Density and Hall Mobility in Impurity-Free Silicon Virtually Doped by External Defect Placement
- Soundarya Nagarajan
- , Ingmar Ratschinski
- , Stefan Schmult
- , Steffen Wirth
- , Dirk König
- , Thomas Mikolajick
- , Daniel Hiller
- , Jens Trommer*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
6
Citations
(Scopus)