Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules

M. Lange*, J. Matsumoto, A. Setiawan, R. Panajotović, J. Harrison, J. C.A. Lower, D. S. Newman, S. Mondal, S. J. Buckman

*Corresponding author for this work

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