Anomalous diffusion mediated by atom deposition into a porous substrate

Pascal Brault*, Christophe Josserand, Jean Marc Bauchire, Amaël Caillard, Christine Charles, Rod W. Boswell

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    50 Citations (Scopus)

    Abstract

    Constant flux atom deposition into a porous medium is shown to generate a dense overlayer and a diffusion profile. Scaling analysis shows that the overlayer acts as a dynamic control for atomic diffusion in the porous substrate. This is modeled by generalizing the porous diffusion equation with a time-dependent diffusion coefficient equivalent to a nonlinear rescaling of time.

    Original languageEnglish
    Article number045901
    JournalPhysical Review Letters
    Volume102
    Issue number4
    DOIs
    Publication statusPublished - 26 Jan 2009

    Fingerprint

    Dive into the research topics of 'Anomalous diffusion mediated by atom deposition into a porous substrate'. Together they form a unique fingerprint.

    Cite this