Abstract
Constant flux atom deposition into a porous medium is shown to generate a dense overlayer and a diffusion profile. Scaling analysis shows that the overlayer acts as a dynamic control for atomic diffusion in the porous substrate. This is modeled by generalizing the porous diffusion equation with a time-dependent diffusion coefficient equivalent to a nonlinear rescaling of time.
| Original language | English |
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| Article number | 045901 |
| Journal | Physical Review Letters |
| Volume | 102 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 26 Jan 2009 |