Abstract
We measure near-field distributions of Mie-type optical modes of silicon nanodisks using apertureless near-field optical microscopy. Excellent agreement with numerical predictions is obtained, further enabling multipole analysis of the observed modes.
Original language | English |
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Number of pages | 1 |
DOIs | |
Publication status | Published - 2014 |
Event | 2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States Duration: 8 Jun 2014 → 13 Jun 2014 |
Conference
Conference | 2014 Conference on Lasers and Electro-Optics, CLEO 2014 |
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Country/Territory | United States |
City | San Jose |
Period | 8/06/14 → 13/06/14 |