Abstract
We measure near-field distributions of Mie-type optical modes of silicon nanodisks using apertureless near-field optical microscopy. Excellent agreement with numerical predictions is obtained, further enabling multipole analysis of the observed modes.
| Original language | English |
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| Number of pages | 1 |
| DOIs | |
| Publication status | Published - 2014 |
| Event | 2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States Duration: 8 Jun 2014 → 13 Jun 2014 |
Conference
| Conference | 2014 Conference on Lasers and Electro-Optics, CLEO 2014 |
|---|---|
| Country/Territory | United States |
| City | San Jose |
| Period | 8/06/14 → 13/06/14 |
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