Atomic Force Microscopy: Imaging with Electrical Double Layer Interactions

Tim J. Senden; Calum J. Drummond; Patrick Kékicheff

doi:10.1021/la00014a004

Atomic Force Microscopy: Imaging with Electrical Double Layer Interactions

Tim J. Senden^*, Calum J. Drummond, Patrick Kékicheff

^*Corresponding author for this work

Research School of Physics

Research output: Contribution to journal › Article › peer-review

143 Citations (Scopus)

Abstract

The relationship between atomic force microscope (AFM) surface images and tip-sample surface forces in aqueous electrolyte solutions is examined. Two novel AFM imaging modes, designated as electrical double layer and “hydration”, are compared with the conventional Born “contact” mode of imaging. Fourier analysis suggests that AFM images may reveal correlation lengths and order parameters characteristic of surface forces.

Original language	English
Pages (from-to)	358-362
Number of pages	5
Journal	Langmuir
Volume	10
Issue number	2
DOIs	https://doi.org/10.1021/la00014a004
Publication status	Published - 1 Feb 1994

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title = "Atomic Force Microscopy: Imaging with Electrical Double Layer Interactions",

abstract = "The relationship between atomic force microscope (AFM) surface images and tip-sample surface forces in aqueous electrolyte solutions is examined. Two novel AFM imaging modes, designated as electrical double layer and “hydration”, are compared with the conventional Born “contact” mode of imaging. Fourier analysis suggests that AFM images may reveal correlation lengths and order parameters characteristic of surface forces.",

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AB - The relationship between atomic force microscope (AFM) surface images and tip-sample surface forces in aqueous electrolyte solutions is examined. Two novel AFM imaging modes, designated as electrical double layer and “hydration”, are compared with the conventional Born “contact” mode of imaging. Fourier analysis suggests that AFM images may reveal correlation lengths and order parameters characteristic of surface forces.

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JO - Langmuir

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Atomic Force Microscopy: Imaging with Electrical Double Layer Interactions

Abstract

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