TY - GEN
T1 - Atomic layer deposition of inverse opals for solar cell applications
AU - Karuturi, Siva Krishna
AU - Liu, Li Jun
AU - Su, Liap Tat
AU - Niu, Wen Bin
AU - Tok, Alfred Ling Yoong
PY - 2013
Y1 - 2013
N2 - Atomic layer deposition (ALD) technique shows superior application in the fabrication of TiO2 inverse opals (IO), compared with conventional infiltration methods. In the present report, TiO2 IO structures were infiltrated by ALD method in a continuous-flow and internally developed stop-flow process, respectively. The corresponding optical and optoelectrical properties of TiO2 IO structures were investigated. The prepared uniform IO structure of 288 nm was used as a photoanode for dye-sensitized solar cells. An efficiency of 2.22% was achieved, which was much higher than that of prepared by conventional solution-infiltration method. It is indicated that ALD method is an effective approach for fabricating TiO2 IO photoanode.
AB - Atomic layer deposition (ALD) technique shows superior application in the fabrication of TiO2 inverse opals (IO), compared with conventional infiltration methods. In the present report, TiO2 IO structures were infiltrated by ALD method in a continuous-flow and internally developed stop-flow process, respectively. The corresponding optical and optoelectrical properties of TiO2 IO structures were investigated. The prepared uniform IO structure of 288 nm was used as a photoanode for dye-sensitized solar cells. An efficiency of 2.22% was achieved, which was much higher than that of prepared by conventional solution-infiltration method. It is indicated that ALD method is an effective approach for fabricating TiO2 IO photoanode.
KW - Atomic layer deposition
KW - Solar cell
KW - TiO inverse opal
UR - http://www.scopus.com/inward/record.url?scp=84886296952&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/AMR.789.3
DO - 10.4028/www.scientific.net/AMR.789.3
M3 - Conference contribution
SN - 9783037857571
T3 - Advanced Materials Research
SP - 3
EP - 7
BT - Advances in Materials, Processing and Manufacturing
T2 - 13th International Conference on Quality in Research, QiR 2013
Y2 - 25 June 2013 through 28 June 2013
ER -