Background reduction in 236U/238U measurements

Raffaele Buompane*, Mario De Cesare, Nicola De Cesare, Antonino Di Leva, Antonio D'Onofrio, L. Keith Fifield, Michaela Fröhlich, Lucio Gialanella, Fabio Marzaioli, Carlo Sabbarese, Filippo Terrasi, Stephen Tims, Anton Wallner

*Corresponding author for this work

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