Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO2

P. Kluth; B. Johannessen; V. Giraud; A. Cheung; C. J. Glover; G. M. De Azevedo; G. J. Foran; M. C. Ridgway

doi:10.1063/1.1803619

Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO₂

P. Kluth^*, B. Johannessen, V. Giraud, A. Cheung, C. J. Glover, G. M. De Azevedo, G. J. Foran, M. C. Ridgway

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Abstract

Au nanocrystals (NCs) fabricated by ion implantation into thin SiO ₂ and annealing were investigated by means of extended x-ray absorption fine structure (EXAFS) spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO₂ matrix. Cumulant analysis of the EXAFS data suggests surface reconstruction or relaxation involving a further shortened bond length. A deviation from the octahedral closed shell structure is apparent for NCs of size 25 Å.

Original language	English
Pages (from-to)	3561-3563
Number of pages	3
Journal	Applied Physics Letters
Volume	85
Issue number	16
DOIs	https://doi.org/10.1063/1.1803619
Publication status	Published - 18 Oct 2004

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title = "Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO2",

abstract = "Au nanocrystals (NCs) fabricated by ion implantation into thin SiO 2 and annealing were investigated by means of extended x-ray absorption fine structure (EXAFS) spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO2 matrix. Cumulant analysis of the EXAFS data suggests surface reconstruction or relaxation involving a further shortened bond length. A deviation from the octahedral closed shell structure is apparent for NCs of size 25 {\AA}.",

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T1 - Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO2

AU - Kluth, P.

AU - Johannessen, B.

AU - Giraud, V.

AU - Cheung, A.

AU - Glover, C. J.

AU - De Azevedo, G. M.

AU - Foran, G. J.

AU - Ridgway, M. C.

PY - 2004/10/18

Y1 - 2004/10/18

N2 - Au nanocrystals (NCs) fabricated by ion implantation into thin SiO 2 and annealing were investigated by means of extended x-ray absorption fine structure (EXAFS) spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO2 matrix. Cumulant analysis of the EXAFS data suggests surface reconstruction or relaxation involving a further shortened bond length. A deviation from the octahedral closed shell structure is apparent for NCs of size 25 Å.

AB - Au nanocrystals (NCs) fabricated by ion implantation into thin SiO 2 and annealing were investigated by means of extended x-ray absorption fine structure (EXAFS) spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO2 matrix. Cumulant analysis of the EXAFS data suggests surface reconstruction or relaxation involving a further shortened bond length. A deviation from the octahedral closed shell structure is apparent for NCs of size 25 Å.

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U2 - 10.1063/1.1803619

DO - 10.1063/1.1803619

M3 - Article

SN - 0003-6951

VL - 85

SP - 3561

EP - 3563

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 16

ER -

Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO₂

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