@inproceedings{f3ce415a45bc4068b7cd002452f980a5,
title = "Building up a database of spectro-photometric standard stars from the UV to the near-IR: A status report",
abstract = "We present a project aimed at establishing a set of 12 spectro-photometric standards over a wide wavelength range from 320 to 2500 nm. Currently no such set of standard stars covering the near-IR is available. Our strategy is to extend the useful range of existing well-established optical flux standards into the near-IR by means of integral field spectroscopy with SINFONI at the VLT combined with state-of-the-art white dwarf stellar atmospheric models. As a solid reference, we use two primary HST standard white dwarfs. This ESO {"}Observatory Programme{"} has been collecting data since February 2007. The analysis of the data obtained in the first year of the project shows that a careful selection of the atmospheric windows used to measure fluxes and the stability of SINFONI make it possible to achieve an accuracy of 3- 6% depending on the wavelength band and stellar magnitude, well within our original goal of 10% accuracy. While this project was originally tailored to the needs of the wide wavelength range (320-2500 nm) of X-shooter on the VLT, it will also benefit any other near-IR spectrographs, providing a huge improvement over existing flux calibration methods.",
keywords = "Calibration, Near infrared, Spectro-photometric standard star, X-shooter",
author = "J. Vernet and F. Kerber and F. Saitta and V. Mainieri and S. D'Odorico and C. Lidman and E. Mason and Bohlin, {R. C.} and T. Rauch and Ivanov, {V. D.} and A. Smette and Walsh, {J. R.} and Fosbury, {R. A.E.} and P. Goldoni and P. Groot and F. Hammer and M. Horrobin and L. Kaper and P. Kjaergaard-Rasmussen and R. Pallavicini and F. Royer",
year = "2008",
doi = "10.1117/12.788676",
language = "English",
isbn = "9780819472267",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Observatory Operations",
note = "Observatory Operations: Strategies, Processes, and Systems II ; Conference date: 24-06-2008 Through 26-06-2008",
}