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Carbon Nanotube Transistors with 60mV/decade Switching and its Capacitance Measurement

Research output: Chapter in Book/Report/Conference proceedingConference Paperpeer-review

Abstract

Recently, we have been able to approach the ultimate vertical scaling limit of carbon nanotube field effect transistors (FETs) and reliably achieve S ~ 60 mV/decade at room temperature, by non-covalent functionalization of single walled carbon nonotubes (SWNTs) with ploy-T DNA molecules, which can impart functional groups of sufficient density and stability for uniform and conformal ALD of high-? dielectrics (HfO2) with thickness down to 2-3 nm on SWNTs. Moreover, the small top gate stack capacitance (~300aF/um) of the SWNT FET has been successfully measured directly, using a special technique. The mobility of the SWNT FETs at room temperature is also extracted by the capacitance measured directly.
Original languageEnglish
Title of host publicationTechnical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show
PublisherTechConnect
Pages57-60
Number of pages4
Volume1
ISBN (Print)1-4200-6182-8
Publication statusPublished - 2007
Externally publishedYes
Event2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007 - Santa Clara, CA, Santa Clara, United States
Duration: 20 May 200724 May 2007

Conference

Conference2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007
Country/TerritoryUnited States
CitySanta Clara
Period20/05/0724/05/07
Other20 May 2007 through 24 May 2007

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