Carrier lifetime studies of deeply penetrating defects in self-ion implanted silicon

D. H. Macdonald*, H. Maeckel, S. Doshi, W. Brendle, A. Cuevas, J. S. Williams, M. J. Conway

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    16 Citations (Scopus)

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