Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD

G. N. Pain; S. P. Russo; R. G. Elliman; L. S. Wielunski; D. Gao; S. R. Glanvill; C. J. Rossouw; A. W. Stevenson; R. S. Rowe; G. B. Deacon; R. S. Dickson; B. O. West

Cd_1-xMn_xTe/Cd_1-yMn_yTe superlattices by low temperature MOCVD

G. N. Pain^*, S. P. Russo, R. G. Elliman, L. S. Wielunski, D. Gao, S. R. Glanvill, C. J. Rossouw, A. W. Stevenson, R. S. Rowe, G. B. Deacon, R. S. Dickson, B. O. West

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

The availability of new organomanganese feedstocks RMn(CO)₅ (R = CH₃ [methyl] or C₆H₅CH₂ [benzyl]) has enabled growth of diluted magnetic semiconductor superlattices Cd_1-xMn_xTe/Cd_1-yTe by low temperature metal organic chemical vapour deposition (MOCVD) for the first time. Secondary ion mass spectrometry (SIMS) was used to measure composition modulation and there was no evidence for carbon contamination from the new sources. X-ray topography, double crystal X-ray diffraction and Nomarski interference microscopy showed preferential facetting and different mosaic spread for some substrate orientations. Particle-induced X-ray emission (PIXE), Rutherford backscattering spectroscopy (RBS), high resolution transmission electron microscopy (HRTEM), and analytical electron microscopy (AEM) were used to evaluate material composition and quality.

Original language	English
Pages (from-to)	35-43
Number of pages	9
Journal	Materials Forum
Volume	15
Issue number	1
Publication status	Published - 1991
Externally published	Yes

Cite this

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title = "Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD",

abstract = "The availability of new organomanganese feedstocks RMn(CO)5 (R = CH3 [methyl] or C6H5CH2 [benzyl]) has enabled growth of diluted magnetic semiconductor superlattices Cd1-xMnxTe/Cd1-yTe by low temperature metal organic chemical vapour deposition (MOCVD) for the first time. Secondary ion mass spectrometry (SIMS) was used to measure composition modulation and there was no evidence for carbon contamination from the new sources. X-ray topography, double crystal X-ray diffraction and Nomarski interference microscopy showed preferential facetting and different mosaic spread for some substrate orientations. Particle-induced X-ray emission (PIXE), Rutherford backscattering spectroscopy (RBS), high resolution transmission electron microscopy (HRTEM), and analytical electron microscopy (AEM) were used to evaluate material composition and quality.",

author = "Pain, {G. N.} and Russo, {S. P.} and Elliman, {R. G.} and Wielunski, {L. S.} and D. Gao and Glanvill, {S. R.} and Rossouw, {C. J.} and Stevenson, {A. W.} and Rowe, {R. S.} and Deacon, {G. B.} and Dickson, {R. S.} and West, {B. O.}",

year = "1991",

language = "English",

volume = "15",

pages = "35--43",

journal = "Materials Forum",

issn = "0883-2900",

publisher = "Institute of Metals and Materials Australasia",

number = "1",

}

TY - JOUR

T1 - Cd1-xMnxTe/Cd1-yMnyTe superlattices by low temperature MOCVD

AU - Pain, G. N.

AU - Russo, S. P.

AU - Elliman, R. G.

AU - Wielunski, L. S.

AU - Gao, D.

AU - Glanvill, S. R.

AU - Rossouw, C. J.

AU - Stevenson, A. W.

AU - Rowe, R. S.

AU - Deacon, G. B.

AU - Dickson, R. S.

AU - West, B. O.

PY - 1991

Y1 - 1991

N2 - The availability of new organomanganese feedstocks RMn(CO)5 (R = CH3 [methyl] or C6H5CH2 [benzyl]) has enabled growth of diluted magnetic semiconductor superlattices Cd1-xMnxTe/Cd1-yTe by low temperature metal organic chemical vapour deposition (MOCVD) for the first time. Secondary ion mass spectrometry (SIMS) was used to measure composition modulation and there was no evidence for carbon contamination from the new sources. X-ray topography, double crystal X-ray diffraction and Nomarski interference microscopy showed preferential facetting and different mosaic spread for some substrate orientations. Particle-induced X-ray emission (PIXE), Rutherford backscattering spectroscopy (RBS), high resolution transmission electron microscopy (HRTEM), and analytical electron microscopy (AEM) were used to evaluate material composition and quality.

AB - The availability of new organomanganese feedstocks RMn(CO)5 (R = CH3 [methyl] or C6H5CH2 [benzyl]) has enabled growth of diluted magnetic semiconductor superlattices Cd1-xMnxTe/Cd1-yTe by low temperature metal organic chemical vapour deposition (MOCVD) for the first time. Secondary ion mass spectrometry (SIMS) was used to measure composition modulation and there was no evidence for carbon contamination from the new sources. X-ray topography, double crystal X-ray diffraction and Nomarski interference microscopy showed preferential facetting and different mosaic spread for some substrate orientations. Particle-induced X-ray emission (PIXE), Rutherford backscattering spectroscopy (RBS), high resolution transmission electron microscopy (HRTEM), and analytical electron microscopy (AEM) were used to evaluate material composition and quality.

UR - http://www.scopus.com/inward/record.url?scp=0025919837&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0025919837

SN - 0883-2900

VL - 15

SP - 35

EP - 43

JO - Materials Forum

JF - Materials Forum

IS - 1

ER -

Cd_1-xMn_xTe/Cd_1-yMn_yTe superlattices by low temperature MOCVD

Abstract

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