Characterisation of ion-implantation-induced disorder in GaAs by EXAFS

Christopher Glover, Kin Man Yu, Mark C Ridgway, Garry J Foran

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)548-551
    JournalJapanese Journal of Applied Physics
    Volume38
    Issue number38-1
    Publication statusPublished - 1999

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