Characterisation of nanostructures via terahertz spectroscopy

Patrick Parkinson; Hannah J. Joyce; X. Xu; Qiang Gao; H. Hoe Tan; C. Jagadish; Laura M. Herz; Michael B. Johnston

doi:10.1109/COMMAD.2010.5699756

Characterisation of nanostructures via terahertz spectroscopy

Patrick Parkinson, Hannah J. Joyce, X. Xu, Qiang Gao, H. Hoe Tan, C. Jagadish, Laura M. Herz, Michael B. Johnston

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We have used terahertz spectroscopy to measure the conductivity and time-resolved photoconductivity of a range of semiconducting nanostructures. This article focuses on our recent terahertz conductivity studies on semiconductor nanowires and single walled carbon nanotubes.

Original language	English
Title of host publication	2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings
Pages	23-24
Number of pages	2
DOIs	https://doi.org/10.1109/COMMAD.2010.5699756
Publication status	Published - 2010
Event	2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 - Canberra, ACT, Australia Duration: 12 Dec 2010 → 15 Dec 2010

Publication series

Name	Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD

Conference

Conference	2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010
Country/Territory	Australia
City	Canberra, ACT
Period	12/12/10 → 15/12/10

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10.1109/COMMAD.2010.5699756

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Parkinson, P., Joyce, H. J., Xu, X., Gao, Q., Tan, H. H., Jagadish, C., Herz, L. M., & Johnston, M. B. (2010). Characterisation of nanostructures via terahertz spectroscopy. In 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings (pp. 23-24). Article 5699756 (Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD). https://doi.org/10.1109/COMMAD.2010.5699756

@inproceedings{802ff851abce4fed9828b0cbce320a2d,

title = "Characterisation of nanostructures via terahertz spectroscopy",

abstract = "We have used terahertz spectroscopy to measure the conductivity and time-resolved photoconductivity of a range of semiconducting nanostructures. This article focuses on our recent terahertz conductivity studies on semiconductor nanowires and single walled carbon nanotubes.",

author = "Patrick Parkinson and Joyce, {Hannah J.} and X. Xu and Qiang Gao and Tan, {H. Hoe} and C. Jagadish and Herz, {Laura M.} and Johnston, {Michael B.}",

year = "2010",

doi = "10.1109/COMMAD.2010.5699756",

language = "English",

isbn = "9781424473328",

series = "Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD",

pages = "23--24",

booktitle = "2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings",

note = "2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 ; Conference date: 12-12-2010 Through 15-12-2010",

}

Parkinson, P, Joyce, HJ, Xu, X, Gao, Q, Tan, HH , Jagadish, C, Herz, LM & Johnston, MB 2010, Characterisation of nanostructures via terahertz spectroscopy. in 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings., 5699756, Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD, pp. 23-24, 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010, Canberra, ACT, Australia, 12/12/10. https://doi.org/10.1109/COMMAD.2010.5699756

Characterisation of nanostructures via terahertz spectroscopy. / Parkinson, Patrick; Joyce, Hannah J.; Xu, X. et al.
2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings. 2010. p. 23-24 5699756 (Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Characterisation of nanostructures via terahertz spectroscopy

AU - Parkinson, Patrick

AU - Joyce, Hannah J.

AU - Xu, X.

AU - Gao, Qiang

AU - Tan, H. Hoe

AU - Jagadish, C.

AU - Herz, Laura M.

AU - Johnston, Michael B.

PY - 2010

Y1 - 2010

N2 - We have used terahertz spectroscopy to measure the conductivity and time-resolved photoconductivity of a range of semiconducting nanostructures. This article focuses on our recent terahertz conductivity studies on semiconductor nanowires and single walled carbon nanotubes.

AB - We have used terahertz spectroscopy to measure the conductivity and time-resolved photoconductivity of a range of semiconducting nanostructures. This article focuses on our recent terahertz conductivity studies on semiconductor nanowires and single walled carbon nanotubes.

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U2 - 10.1109/COMMAD.2010.5699756

DO - 10.1109/COMMAD.2010.5699756

M3 - Conference contribution

SN - 9781424473328

T3 - Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD

SP - 23

EP - 24

BT - 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings

T2 - 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010

Y2 - 12 December 2010 through 15 December 2010

ER -

Parkinson P, Joyce HJ, Xu X, Gao Q, Tan HH , Jagadish C et al. Characterisation of nanostructures via terahertz spectroscopy. In 2010 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2010 Proceedings. 2010. p. 23-24. 5699756. (Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD). doi: 10.1109/COMMAD.2010.5699756

Characterisation of nanostructures via terahertz spectroscopy

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