Characterisation of nitrogen-related defects in compound semiconductors by near-edge x-ray absorption fine structure

Mladen Petravic*, Zlatko Majlinger, Ana Bozanic, Yaw Wen Yang, Michael Gao, CCrotti

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Citations (Scopus)

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    Physics