Skip to main navigation Skip to search Skip to main content

Characterisation of the mechanical properties of thin film cantilevers with the atomic force microscope

  • C. J. Drummond*
  • , T. J. Senden
  • *Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

19 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Characterisation of the mechanical properties of thin film cantilevers with the atomic force microscope'. Together they form a unique fingerprint.
Sort by

Material Science