Characterization and Diagnosis of Silicon Wafers, Ingots, and Solar Cells

Andrés Cuevas; Daniel Macdonald; Ronald A. Sinton

doi:10.1016/B978-0-12-386964-7.00015-9

Characterization and Diagnosis of Silicon Wafers, Ingots, and Solar Cells

Andrés Cuevas^*, Daniel Macdonald, Ronald A. Sinton

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

2 Citations (Scopus)

Abstract

Develop high-efficiency solar cell technologies requires that material quality and the impact of each fabrication step are closely monitored. A broad range of characterization techniques has been developed in recent years, many of them fast enough for in-line process control. It is imperative to understand the limitations and applicability of each technique. This chapter outlines the common principles underlying the most important characterization methods.

Original language	English
Title of host publication	Solar Cells
Publisher	Elsevier Ltd.
Pages	469-499
Number of pages	31
ISBN (Print)	9780123869647
DOIs	https://doi.org/10.1016/B978-0-12-386964-7.00015-9
Publication status	Published - 2013

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10.1016/B978-0-12-386964-7.00015-9

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title = "Characterization and Diagnosis of Silicon Wafers, Ingots, and Solar Cells",

abstract = "Develop high-efficiency solar cell technologies requires that material quality and the impact of each fabrication step are closely monitored. A broad range of characterization techniques has been developed in recent years, many of them fast enough for in-line process control. It is imperative to understand the limitations and applicability of each technique. This chapter outlines the common principles underlying the most important characterization methods.",

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AU - Cuevas, Andrés

AU - Macdonald, Daniel

AU - Sinton, Ronald A.

PY - 2013

Y1 - 2013

N2 - Develop high-efficiency solar cell technologies requires that material quality and the impact of each fabrication step are closely monitored. A broad range of characterization techniques has been developed in recent years, many of them fast enough for in-line process control. It is imperative to understand the limitations and applicability of each technique. This chapter outlines the common principles underlying the most important characterization methods.

AB - Develop high-efficiency solar cell technologies requires that material quality and the impact of each fabrication step are closely monitored. A broad range of characterization techniques has been developed in recent years, many of them fast enough for in-line process control. It is imperative to understand the limitations and applicability of each technique. This chapter outlines the common principles underlying the most important characterization methods.

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U2 - 10.1016/B978-0-12-386964-7.00015-9

DO - 10.1016/B978-0-12-386964-7.00015-9

M3 - Chapter

SN - 9780123869647

SP - 469

EP - 499

BT - Solar Cells

PB - Elsevier Ltd.

ER -

Characterization and Diagnosis of Silicon Wafers, Ingots, and Solar Cells

Abstract

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