TY - JOUR
T1 - Characterization of boron nitride nanosheets synthesized by boron-ammonia reaction
AU - Nadeem, Aamir
AU - Raza, Mohsin Ali
AU - Maqsood, Muhammad Faheem
AU - Ilyas, Muhammad Tasaduq
AU - Westwood, Aidan
AU - Rehman, Zaeem Ur
N1 - Publisher Copyright:
© 2020 Elsevier Ltd and Techna Group S.r.l.
PY - 2020/8/15
Y1 - 2020/8/15
N2 - Boron nitride nanosheets (BNNS) with thickness 5–11 nm were successfully produced when pure boron powder (1–2 μm) interacted with ammonia gas in chemical vapour deposition set up. Under the optimized parameters, at 1200°C and for uninterrupted 1 h of reaction duration, 2D BNNS with thickness of ca.11 nm were synthesized. BNNS were characterized by X-ray diffraction (XRD) for crystal structure, scanning electron microscopy for dimensions and morphology, energy dispersive X-ray analysis for chemical composition and Fourier transform infrared spectroscopy for sp2 BN bond detection. The thickness of BNNS determined from both XRD data (using Scherrer equation) and atomic force microscopic analysis confirmed the stated product thickness. The BNNS obtained at 1200°C had high crystallinity, purity and yield.
AB - Boron nitride nanosheets (BNNS) with thickness 5–11 nm were successfully produced when pure boron powder (1–2 μm) interacted with ammonia gas in chemical vapour deposition set up. Under the optimized parameters, at 1200°C and for uninterrupted 1 h of reaction duration, 2D BNNS with thickness of ca.11 nm were synthesized. BNNS were characterized by X-ray diffraction (XRD) for crystal structure, scanning electron microscopy for dimensions and morphology, energy dispersive X-ray analysis for chemical composition and Fourier transform infrared spectroscopy for sp2 BN bond detection. The thickness of BNNS determined from both XRD data (using Scherrer equation) and atomic force microscopic analysis confirmed the stated product thickness. The BNNS obtained at 1200°C had high crystallinity, purity and yield.
KW - Atomic force microscopy
KW - Boron nitride nanosheets
KW - Chemical vapour deposition
KW - Scanning electron microscopy
KW - X-ray diffraction
UR - https://www.scopus.com/pages/publications/85085014400
U2 - 10.1016/j.ceramint.2020.05.132
DO - 10.1016/j.ceramint.2020.05.132
M3 - Article
AN - SCOPUS:85085014400
SN - 0272-8842
VL - 46
SP - 20415
EP - 20422
JO - Ceramics International
JF - Ceramics International
IS - 12
ER -