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Characterization of Passivation Layer Losses using on-chip Chalcogenide Glass Resonators with Ultra-high Q-factor in the Mid-infrared Region

  • Daewon Suk
  • , Kiyoung Ko
  • , Jingyu Kim
  • , Sang Hee Ko Park
  • , Rongping Wang
  • , Duk Yong Choi*
  • , Hansuek Lee*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Paperpeer-review

Abstract

We optically characterize the absorption loss and surface property of nanometer-thin Al2O3 and TiO2 passivation layers using chalcogenide glass-based on-chip resonators with ultrahigh Q-factor in the mid-IR region.

Original languageEnglish
Title of host publication2024 Conference on Lasers and Electro-Optics, CLEO 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-2
Number of pages2
ISBN (Electronic)9781957171395
DOIs
Publication statusPublished - 2024
Event2024 Conference on Lasers and Electro-Optics, CLEO 2024 - Charlotte, United States
Duration: 7 May 202410 May 2024

Publication series

Name2024 Conference on Lasers and Electro-Optics, CLEO 2024

Conference

Conference2024 Conference on Lasers and Electro-Optics, CLEO 2024
Country/TerritoryUnited States
CityCharlotte
Period7/05/2410/05/24

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