Characterization of SiNx/a-Si:H crystalline silicon surface passivation under UV light exposure

Mario Tucci; Luca Serenelli; S De Luliis; M Izzi; P Mangiapane; Andres Cuevas; Jonathon Mitchell

Characterization of SiNx/a-Si:H crystalline silicon surface passivation under UV light exposure

Mario Tucci, Luca Serenelli, S De Luliis, M Izzi, P Mangiapane, Andres Cuevas, Jonathon Mitchell

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings of the European Photovoltaic Solar Energy Conference 2006
Editors	Conference Program Committee
Place of Publication	Germany
Publisher	John Wiley & Sons Inc.
Pages	1404-1407
Edition	Peer Reviewed
Publication status	Published - 2006
Event	European Photovoltaic Solar Energy Conference 2006 - Dresden Germany Duration: 1 Jan 2006 → …

Conference

Conference	European Photovoltaic Solar Energy Conference 2006
Period	1/01/06 → …
Other	September 4-8 2006

Cite this

@inproceedings{bd9f10f8e3d145a7a2d000776b1b8d04,

title = "Characterization of SiNx/a-Si:H crystalline silicon surface passivation under UV light exposure",

author = "Mario Tucci and Luca Serenelli and {De Luliis}, S and M Izzi and P Mangiapane and Andres Cuevas and Jonathon Mitchell",

year = "2006",

language = "English",

pages = "1404--1407",

editor = "{Conference Program Committee}",

booktitle = "Proceedings of the European Photovoltaic Solar Energy Conference 2006",

publisher = "John Wiley & Sons Inc.",

edition = "Peer Reviewed",

note = "European Photovoltaic Solar Energy Conference 2006 ; Conference date: 01-01-2006",

}

Tucci, M, Serenelli, L, De Luliis, S, Izzi, M, Mangiapane, P, Cuevas, A & Mitchell, J 2006, Characterization of SiNx/a-Si:H crystalline silicon surface passivation under UV light exposure. in CPC (ed.), Proceedings of the European Photovoltaic Solar Energy Conference 2006. Peer Reviewed edn, John Wiley & Sons Inc., Germany, pp. 1404-1407, European Photovoltaic Solar Energy Conference 2006, 1/01/06.

Characterization of SiNx/a-Si:H crystalline silicon surface passivation under UV light exposure. / Tucci, Mario; Serenelli, Luca; De Luliis, S et al.
Proceedings of the European Photovoltaic Solar Energy Conference 2006. ed. / Conference Program Committee. Peer Reviewed. ed. Germany: John Wiley & Sons Inc., 2006. p. 1404-1407.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Characterization of SiNx/a-Si:H crystalline silicon surface passivation under UV light exposure

AU - Tucci, Mario

AU - Serenelli, Luca

AU - De Luliis, S

AU - Izzi, M

AU - Mangiapane, P

AU - Cuevas, Andres

AU - Mitchell, Jonathon

PY - 2006

Y1 - 2006

M3 - Conference contribution

SP - 1404

EP - 1407

BT - Proceedings of the European Photovoltaic Solar Energy Conference 2006

A2 - null, Conference Program Committee

PB - John Wiley & Sons Inc.

CY - Germany

T2 - European Photovoltaic Solar Energy Conference 2006

Y2 - 1 January 2006

ER -