Cold sample preparation for cross-sectional transmission electron microscopy: Cu nanocrystals embedded in 2 μm SiO2 films

Cold sample preparation for cross-sectional transmission electron microscopy: Cu nanocrystals embedded in 2 μm SiO₂ films

B. Johannessen^*, D. J. Llewellyn, P. Kluth, M. C. Ridgway

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	600-601
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606063082
Publication status	Published - Aug 2006

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title = "Cold sample preparation for cross-sectional transmission electron microscopy: Cu nanocrystals embedded in 2 μm SiO2 films",

author = "B. Johannessen and Llewellyn, {D. J.} and P. Kluth and Ridgway, {M. C.}",

year = "2006",

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language = "English",

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TY - JOUR

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T2 - Cu nanocrystals embedded in 2 μm SiO2 films

AU - Johannessen, B.

AU - Llewellyn, D. J.

AU - Kluth, P.

AU - Ridgway, M. C.

PY - 2006/8

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M3 - Article

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -