Comparison of local distortions in Ba8Ga16X30 (X = Si, Ge, Sn): An EXAFS study

Trevor Keiber*, Patrick Nast, Scott Medling, Frank Bridges, Koichiro Suekuni, Marcos A. Avila, Toshiro Takabatake

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

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