Comparison of local distortions in Ba8Ga16X30 (X = Si, Ge, Sn): An EXAFS study

Trevor Keiber*, Patrick Nast, Scott Medling, Frank Bridges, Koichiro Suekuni, Marcos A. Avila, Toshiro Takabatake

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    9 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Comparison of local distortions in Ba8Ga16X30 (X = Si, Ge, Sn): An EXAFS study'. Together they form a unique fingerprint.

    Material Science

    Engineering

    Earth and Planetary Sciences

    Physics