Comparison of proton and arsenic implantation-induced intermixing in InGaAsP/InGaAs/InP and InAlGaAs/InGaAs/InP quantum wells

Sichao Du*, L. Fu, H. H. Tan, C. Jagadish

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    In this work, we studied the proton and arsenic ion implantation-induced intermixing in InGaAsP/InGaAs and InAlGaAs/InGaAs quantum wells. The results were compared and discussed based on the defect formation and evolution process under the different implantation conditions and QW barrier materials.

    Original languageEnglish
    Title of host publicationProceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008
    Pages32-35
    Number of pages4
    DOIs
    Publication statusPublished - 2008
    Event2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008 - Melbourne, VIC, Australia
    Duration: 25 Feb 200829 Feb 2008

    Publication series

    NameProceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008

    Conference

    Conference2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008
    Country/TerritoryAustralia
    CityMelbourne, VIC
    Period25/02/0829/02/08

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