Compensation of motion coupling effect in AFM imaging

Md Sohel Rana; Hemanshu R. Pota; Ian R. Petersen

doi:10.1049/MNL.2019.0334

Compensation of motion coupling effect in AFM imaging

Md Sohel Rana^*, Hemanshu R. Pota, Ian R. Petersen

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

The acquisition of a high-quality imaging performance by an atomic force microscope is significantly influenced by the motion coupling effect of its key scanning unit, i.e. its piezoelectric tube scanner. In this Letter, to improve its performance, a MIMO model predictive control scheme for reducing this effect is proposed. The proposed controller achieves this by greatly overcoming the problem of tilted characters in the atomic force microscopy (AFM) scanned images. The experimental results are demonstrating the effectiveness of the proposed control technique.

Original language	English
Pages (from-to)	863-865
Number of pages	3
Journal	Micro and Nano Letters
Volume	15
Issue number	12
DOIs	https://doi.org/10.1049/MNL.2019.0334
Publication status	Published - 2020

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10.1049/MNL.2019.0334

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@article{4106f46c67204e64b44b9efd850403ea,

title = "Compensation of motion coupling effect in AFM imaging",

abstract = "The acquisition of a high-quality imaging performance by an atomic force microscope is significantly influenced by the motion coupling effect of its key scanning unit, i.e. its piezoelectric tube scanner. In this Letter, to improve its performance, a MIMO model predictive control scheme for reducing this effect is proposed. The proposed controller achieves this by greatly overcoming the problem of tilted characters in the atomic force microscopy (AFM) scanned images. The experimental results are demonstrating the effectiveness of the proposed control technique.",

author = "Rana, {Md Sohel} and Pota, {Hemanshu R.} and Petersen, {Ian R.}",

note = "Publisher Copyright: {\textcopyright} The Institution of Engineering and Technology 2020.",

year = "2020",

doi = "10.1049/MNL.2019.0334",

language = "English",

volume = "15",

pages = "863--865",

journal = "Micro and Nano Letters",

issn = "1750-0443",

publisher = "John Wiley & Sons Inc.",

number = "12",

}

TY - JOUR

T1 - Compensation of motion coupling effect in AFM imaging

AU - Rana, Md Sohel

AU - Pota, Hemanshu R.

AU - Petersen, Ian R.

N1 - Publisher Copyright: © The Institution of Engineering and Technology 2020.

PY - 2020

Y1 - 2020

N2 - The acquisition of a high-quality imaging performance by an atomic force microscope is significantly influenced by the motion coupling effect of its key scanning unit, i.e. its piezoelectric tube scanner. In this Letter, to improve its performance, a MIMO model predictive control scheme for reducing this effect is proposed. The proposed controller achieves this by greatly overcoming the problem of tilted characters in the atomic force microscopy (AFM) scanned images. The experimental results are demonstrating the effectiveness of the proposed control technique.

AB - The acquisition of a high-quality imaging performance by an atomic force microscope is significantly influenced by the motion coupling effect of its key scanning unit, i.e. its piezoelectric tube scanner. In this Letter, to improve its performance, a MIMO model predictive control scheme for reducing this effect is proposed. The proposed controller achieves this by greatly overcoming the problem of tilted characters in the atomic force microscopy (AFM) scanned images. The experimental results are demonstrating the effectiveness of the proposed control technique.

UR - http://www.scopus.com/inward/record.url?scp=85140316735&partnerID=8YFLogxK

U2 - 10.1049/MNL.2019.0334

DO - 10.1049/MNL.2019.0334

M3 - Article

SN - 1750-0443

VL - 15

SP - 863

EP - 865

JO - Micro and Nano Letters

JF - Micro and Nano Letters

IS - 12

ER -

Compensation of motion coupling effect in AFM imaging

Abstract

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